Webcast: Metrology Gears for the Nanotech Age

Originally broadcast October 21, 2008

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Inspection, measurement, and test instrumentation are integral to nanotech applications, and vital to advances in the design of nanomaterials and ultimately for the manufacturing of nanotechnology-based products. However, the resolution, accuracy and capability of many metrology technologies are reaching their limits, and may not meet all the needs of nanotech manufacturing processes. Revolutionary, rather than evolutionary, advances become necessary. Possible metrology technology options will be discussed by experts in the field.

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Moderator:

Alexander Braun Senior Editor Semiconductor International

Panelists:

Alain Diebold College of Nanoscale Science and Engineering (CNSE) of the University at Albany (New York)

 

Christopher Ober Cornell University

 

Wilfried Vandervorst IMEC

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