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Webcast: Advanced Process Control Enables Next-Generation Devices


Now Available On Demand
Originally broadcast July 12, 2007

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Our industry crossed the sub-100 nm border into nanotechnology quite some time ago. In this demanding environment of smaller and more delicate architectures, as well as shorter and increasingly unforgiving process windows where sometimes even irreducible differences in the components of identical tool chambers can influence yield results, advanced process control (APC) becomes an urgent necessity. This webcast’s panel of distinguished experts discuss some of the latest advances in APC and examine what will be required to continue to support Moore’s Law in the future.

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Moderator:

Alexander E. Braun
Senior Editor
Semiconductor International

Panelists:

Nital Patel
Senior Staff Process Control Systems Architect
Intel Corp.
James Dougan
Principal Staff Engineer
Freescale Semiconductor
Kevin Brady
Principal Investigator, Technical Research Project
Infrastructure for Integrated Electronics
Design and Manufacture

National Institute of Standards and Technology (NIST)

Webcast Sponsor

Particle Measuring Systems


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Posted: Jun 8, 2007


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