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Semiconductor International - October 01, 2001

Cover Story

ALD Breaks Materials, Conformality Barriers
ALD, widely considered the next step in thin-film deposition, promises unparalleled deposition control as well as capabilities impossible with current methods - all of it at the smallest possible dimensions. Three-dimensional films that coat around surfaces, air-gap structures, 3-D vertical structures without bottoms or with covered bottoms, and other new topographies are almost within reach.



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