Podcasts : SI On the Scene : IMEC Expecting Two EUV Source Upgrades
IMEC Expecting Two EUV Source Upgrades
As a follow-up from the EUVL Symposium in Sapporo, Japan, Kurt Ronse, IMEC’s director of lithography, talks about the source upgrades expected on the EUV alpha demo tool at IMEC, plus a variety of other issues surrounding EUV lithography’s development.
Posted: Nov 27, 2007
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