Log In   |  Register Free Newsletter Subscription
Skip navigation
Zibb
Subscribe to Semiconductor International

Podcasts : All Podcasts : Metrology's Challenges at the Nanoscale Realm

Alain Diebold is an Empire Innovation Professor of nanoscale science at the College of Nanoscale Science and Engineering (CNSE) of the University at Albany, New York, as well as the executive director of CNSE’s Center for Nanoscale Metrology. A recognized authority in the field of metrology, he talks about the future of nanotech metrology.

Metrology's Challenges at the Nanoscale Realm

Posted: Nov 1, 2008 | Listen Now | Download MP3 | | Subscribe Now and never miss an episode
Advertisement
PV_Aug09_160x160od
Advertisement
NEWSLETTERS
SI NewsBreak and Special Reports
Photovoltaics Report
Wafer Processing Report
Litho & Metrology Report
Packaging Report



Please read our Privacy Policy

OTHER NEWS FROM RBI
About Us   |   Advertising Info   |   Site Map   |   Contact Us   |   FREE Subscription   |   RSS
© 2010 Reed Business Information, a division of Reed Elsevier Inc. All rights reserved.
Use of this Web site is subject to its Terms of Use | Privacy Policy
Please visit these other Reed Business sites