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TOP STORY... January 6, 2009
Foundries Targeted at International Reliability Physics Symposium Ensuring the reliability of chips made at foundries will be a major theme at this year's International Reliability Physics Symposium (IRPS), planned for April 26-30 in Montreal. The 2009 symposium will feature an invited speech from S.Y. Pai, director of reliability at Xilinx Inc. (San Jose). The conference also will take up high-k dielectric breakdown mechanisms, leakage in compound semiconductors, interconnect failure modes and electrostatic discharge (ESD) protection. Read more >>
Survey of Wafer Fab Reticle Control Quality Strategies
Semiconductor manufacturing tools exhibit complex and quality that result in process tool malfunctions. This paper details a process - manufacturing excursion involving a wafer backside etch process that negatively impacted manufacturing on metal interconnect etch process toolsets. Download now!
FEATURED ARTICLE...
Bright New Phone Displays That Don't Guzzle Power Anne Eisenberg reports on new types of power-saving displays in a New York Times article that features displays from Pixtronix and Qualcomm. Pixtronix uses energy-efficient LED bulbs that do not require energy-robbing backlighting, while Qualcomm has developed a reflective display that works fine in sunlight, Eisenberg writes.
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