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Semiconductor International : Packaging Report

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January 7, 2009
IN THIS EDITION
NEWS
 
» EVG and Brewer Science Enhance Thin Wafer Bonding Lab
» Kulicke & Soffa Announces Tender Offer for Notes
» Aehr Test Systems Receives Order for Burn-in and Test System
» Tessera Extends Licensing Agreement With Motorola
» ASE Reports Monthly and Quarterly Revenues
» Sanyo Mulling Cut in Regular Workers in Semiconductor Operation
EDITOR'S PICKS
 
» Wafer-Level Packaging Trends Up in 2009
» Shin-Etsu Support Jig Handles Thin Wafers for Reflow Soldering
PRODUCTS
 
» Dicing Frame Prober
» Thermal Imager Upgrade
UPCOMING EVENTS
 
Dear Subscriber,

Demand for wafer-level packaging (WLP) is increasing, and there are several very interesting emerging trends to watch in 2009 and beyond. In an exclusive interview with Advanced Semiconductor Engineering's Director of Engineering, John Hunt, and TechSearch Inc.'s President, Jan Vardaman, they describe the various trends to keep an eye on. You can read all about it in the first item in the Editor's Picks section. To keep up with all the latest packaging trends, bookmark our Semiconductor Packaging Technology Channel:
www.semiconductor.net/packaging

Sally Cole Johnson, Contributing Editor
scolejohnson@mac.com

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NEWS

EVG and Brewer Science Enhance Thin Wafer Bonding Lab
PR Newswire, 1/7/2009

EV Group (EVG) and Brewer Science Inc. today announced the installation of an EVG 500 series wafer-bonding system at Brewer Science's Taiwan applications lab. Located in Hsinchu Science Park, this joint effort offers customers timely localized support in the Asia-Pacific region for 3-D IC and other advanced process development programs. More

Kulicke & Soffa Announces Tender Offer for Notes
Business Wire, 1/6/2009

Kulicke & Soffa Industries Inc. announced that it has commenced a tender offer to repurchase for cash up to all of its $62M aggregate principal amount of its outstanding 1.0% Convertible Subordinated Notes Due 2010. More

Aehr Test Systems Receives Order for Burn-in and Test System
PR Newswire, 1/6/2009

Aehr Test Systems has received a second order for the Advanced Burn-in and Test System (ABTS) from a leading European company. More

Tessera Extends Licensing Agreement With Motorola
Business Wire, 1/5/2009

Tessera Technologies announced that Motorola Inc. has extended its patent licensing option agreement with Tessera. More

ASE Reports Monthly and Quarterly Revenues
PR Newswire, 1/7/2009

Advanced Semiconductor Engineering Inc. (ASE) announced its unaudited consolidated net revenues for December and fourth quarter of 2008. More

Sanyo Mulling Cut in Regular Workers in Semiconductor Operation
Jiji Press Ticker Service, 1/5/2009

Sanyo Semiconductor Co., a wholly owned unit of Sanyo Electric Co., is considering reducing regular employees probably through a voluntary early retirement program, sources said. More

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EDITOR'S PICKS

Wafer-Level Packaging Trends Up in 2009
Sally Cole Johnson, Contributing Editor -- Semiconductor International, 1/7/2009

Wafer-level packaging trends include increasing demand, higher I/O, finer pitch, increased power for automotive applications and high-accuracy precision devices, said John Hunt, director of engineering at Advanced Semiconductor Engineering. Taiwan-based ASE is developing through-silicon via (TSV) capability, and fan-out packaging. ASE also has a licensing deal with Infineon in the field. More

Shin-Etsu Support Jig Handles Thin Wafers for Reflow Soldering
Kenji Tsuda, Asia Contributing Editor -- Semiconductor International, 1/5/2009

Shin-Etsu Polymer Co. Ltd. has developed a jig for handling thin wafers that can endure 260°C in a solder reflow furnace. The tool makes it possible to use a silicone film to attach solder balls to thinned wafers for 3-D stacked chips. More

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PRODUCTS</ B>

Dicing Frame Prober

WDF 12DP is a 300 mm dicing frame prober designed to address the increasing demand for probing ultrathin and diced wafers. Tokyo Electron Ltd., Tokyo More

Thermal Imager Upgrade

The latest version of the Micro thermal imaging system for semiconductor failure analysis includes a thermal imaging camera with 320 x 240 element uncooled detector and 0.05°C sensitivity, 20 micron microscopic lens, wide angle lens, and 16 bit digital Camera Link interface. OptoTherm Inc., Sewickley, Pa. More

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UPCOMING EVENTS

Tessera Technology Symposium

2009 European Systems Packaging Workshop

2009 Flexible Electronics & Displays Conference

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