Date: Sept. 4-5, 2008

Location: Dallas, Texas

Focused ion beam (FIB) systems now have numerous and important applications in the semiconductor and electronics industries. This includes making device edits on prototype devices to fix design errors or incorporate last-minute changes requested by clients, running experiments, probing circuits for failure analysis (FA), and others. FIB systems can make these changes in a matter of hours. They are a boon for performing system- and board-level checks. Using the FIB, engineers can iteratively modify ICs until they achieve the correct result. Finally, engineers can prepare a specific site on a sample for the scanning and transmission electron microscopes (SEM/TEM) easily and repeatably. If you are part of the FA community or involved in related analytical fields, and would like to acquire a basic understanding of FIB system operations currently being used in the industry, you should attend this short course.

www.semitracks.com/courses/fib-course.htm