Semiconductor International NewsBreak
TOP STORY... November 25, 2008

Editor's Note: In honor of the upcoming holiday in the U.S., NewsBreak and NewsBreak Special Report will not be published the remainder of the week. Happy Thanksgiving!

UMC Yields 45 nm SRAM With High-k/Metal Gate
Semiconductor foundry UMC today announced a significant milestone for its high-k/metal-gate technology with validation of the process through 45 nm SRAM product yield. This achievement is a first key step in demonstrating technology performance and process reliability for high-k/metal gate technology, which will be used for UMC's 32/28 nm process.
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Perspectives From the Leading Edge: You Can't Always Get What You Want
SI blogger and 3-D integration expert Phil Garrou gives his perspective on the recent RTI 3D Integration Conference, noting a few major themes, all of which are linked to the line popularized by the Rolling Stones in the late '60s. "While there were no blockbuster announcements last week (what we want), we did get assurances that we are steadily, if not rapidly, moving forward and that we are not wasting our time or money chasing this technology (what we need)," Garrou writes.

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