November 19, 2008
IN THIS EDITION
NEWS
 
» Advanced Fine-Pitch Packaging Development at 65 nm in Singapore
» IMEC and Panasonic Sign Research Contract
» SUSS MicroTec Introduces iVista Failure Analysis Tool
» Semitool Full-Year Revenues Increase 11%
» Patent Award: Interposer Substrate
» Tessera Licenses Shellcase MVP Technology to Qtech
» Amkor Licenses FusionQuad Packaging Technology to ASAT
» Tessera Signs Agreement With Motorola
EDITOR'S PICKS
 
» 3-D Integration Development Threatened by Economic Uncertainty
» 3-D Integration Lacking in Design and Test Support
PRODUCTS
 
» Electrostatic Voltage Sensor
» Planar Air-Bearing Motion Platform
UPCOMING EVENTS
 
Dear Subscriber,

Covering 3-D integration at a symposium and conference this week, Senior Editor Alexander Braun landed two articles under the "Editor's Picks," as must-reads. He provides details about the challenges facing 3-D integration (which include test, yield and design), and also describes the impact the current economic "uncertainty" is having on 3-D integration development. To keep up with more in 3-D integration and other packaging fronts, check back regularly at our Packaging Technology Channel:

www.semiconductor.net/packaging

Sally Cole Johnson, Contributing Editor
scolejohnson@mac.com

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NEWS

Advanced Fine-Pitch Packaging Development at 65 nm in Singapore
Business Wire, 11/17/2008

Singapore's Institute of Microelectronics (IME) and Chartered Semiconductor Manufacturing have successfully optimized a range of fine-pitch packaging technologies for copper metallization and low-k dielectric silicon processes at 65 nm and below. The Chartered-IME collaboration has led to a greater understanding of chip-package interaction of low-k devices through modeling, simulations and reliability verifications on silicon. More

IMEC and Panasonic Sign Research Contract
Business Wire, 11/12/2008

IMEC and Panasonic signed a joint research contract covering most of the research domains of IMEC. More

SUSS MicroTec Introduces iVista Failure Analysis Tool
Business Wire, 11/11/2008

SUSS MicroTec Test Systems announced the iVista LC digital microscope capable of delivering high-resolution digital images in conjunction with laser-cutting capabilities. More

Semitool Full-Year Revenues Increase 11%
Marketwire, 11/11/2008

Semitool Inc. reported financial results for its fourth quarter and full fiscal year ended Sept. 30, 2008. Fourth quarter revenue increased 27% to $60.1M from $47.2M in last year's fourth quarter. More

Patent Award: Interposer Substrate
US Fed News, 11/14/2008

Researchers at Renesas Technology Corp. (Tokyo) have developed an interposer substrate manufacturing method that provides a "method for forming a narrow-pitch flip-chip bonding electrode and a wire bonding electrode at the same time so as to reduce cost of a substrate." More

Tessera Licenses Shellcase MVP Technology to Qtech
Business Wire, 11/11/2008

Tessera Technologies Inc. said Q Technology has licensed Tessera's image sensor packaging technology. More

Amkor Licenses FusionQuad Packaging Technology to ASAT
Business Wire, 11/7/2008

Amkor Technology Inc. said ASAT Holdings Ltd. has entered into an agreement to license Amkor's FusionQuad package technology. More

Tessera Signs Agreement With Motorola
Business Wire, 11/10/2008

Tessera Technologies Inc. announced that Motorola Inc. has signed an agreement with Tessera for an option to license Tessera's chip-scale packaging (CSP) technology. More

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EDITOR'S PICKS

3-D Integration Development Threatened by Economic Uncertainty
Alexander E. Braun, Senior Editor -- Semiconductor International, 11/17/2008

As presenters and attendees prepared for the opening of this year's 3-D Architectures for Semiconductor Integration and Packaging conference, confidence in the technology's future was mixed with concern about survival in the current economy. More

3-D Integration Lacking in Design and Test Support
Alexander E. Braun, Senior Editor -- Semiconductor International, 11/18/2008

At a recent symposium on 3-D integration, leading expert Philip Garrou detailed the rise of the technology as well as the challenges facing it, including test, yield and design. More

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PRODUCTS

Electrostatic Voltage Sensor

Model 875 sensor is designed for in-line monitoring of electrostatic charge buildup in real time. The sensor features a measurement probe with automatic calibration technology, which enhances the utility of the sensor by maintaining high accuracy and speed, even as the distance between the non-contacting probe and the monitored surface changes. Trek Inc., Medina, N.Y. More

Planar Air-Bearing Motion Platform

The PlanarHD "high dynamic" air-bearing motion platform has been designed specifically to maximize throughput by providing up to 2 m/sec scan velocity and 2.5 g acceleration. The design uses a highly engineered mechanical structure that increases air-bearing stiffness and decreases moving mass. Aerotech Inc., Pittsburgh More

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UPCOMING EVENTS

Dec. 1-2, 2008: Ninth VLSI Packaging Workshop

Dec. 9-12, 2008: EPTC 2008

Dec. 10-12, 2008: Electrical Design of Advanced Packaging & Systems

Copyright 2008 Reed Business Information, a division of Reed Elsevier Inc. All Rights Reserved.
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