Semiconductor International NewsBreak
Semiconductor International NewsBreak
TOP STORY... September 4, 2008

Hard X-Ray Microscope
Opens New Vistas

Senior Editor Alex Braun interviewed the keepers of the highest resolution microscope of its type, the Hard X-Ray Nanoprobe now operational at the Argonne National Laboratory. The nanoprobe is being used to study nanoscale materials and devices that might find application in more efficient photovoltaic cells and in next-generation computing.
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MORE NEWS...

Solar Parties Put Heads Together to Advance Renewable Energies

SAFC Hitech Advances on Phase Change Memory Front

German Ministry Funds Mask Project

NIST and SNU Researchers Improve Organic Semiconductors

NIST Studies How New Helium Ion Microscope Measures Up

Power MOSFET Superjunctions Reduce Resistance and Gate Charge

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Profitless Prosperity
Tom Mariano, vice president of the Industrial Equipment Practice at software firm Foliage (Burlington, Mass.), argues that there are as-yet unexploited areas of R&D efficiency that semiconductor equipment companies can take advantage of, including automated testing and product line architectures (PLAs). "With the promise of PLAs comes the promise of rapid new product development. Consolidated PLAs mean that the underlying structure and technologies stay the same from product to product, and only the higher level product 'personality' needs to change," Mariano writes in the September issue of Semiconductor International.

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