July 16, 2008
IN THIS EDITION
NEWS
 
» New Packaging Technologies Dominate Best of West Awards
» SUSS MicroTec Unveils 300 mm Mask Aligner for 3-D Packaging
» EV Group Supplies TSV Equipment to STMicroelectronics
» Gartner Cuts Semi Equipment Forecast to -22.4%
» Aehr Test Systems Receives Order for Burn-In and Test System
» iNEMI Issues Recommendations for Managing Lead-Free Solder Alloys
» Nvidia Reports Thermal Issues Caused Packaging Failures
» High-Density Packaging Possibilities
EDITOR'S PICKS
 
» Amkor Unveils High-Performance Flip-Chip Packaging Technology
» Why 3-D TSV is Hotter Than Hot
» Wire Bond Tester Targets Zero Field Failures
PRODUCTS
 
» Wafer Bonding Platform
» Sputter Deposition System
UPCOMING EVENTS
 
Dear Subscriber,

If you have yet to discover why 3-D TSVs are one of the hottest topics in the industry, you can find out by reading Jan Vardaman's article "Why 3-D TSV is Hotter Than Hot." Interested in a flip-chip technology evolution? Be sure to check out "Amkor Unveils High-Performance Flip-Chip Packaging Technology." Want to find out more information about a wire bond tester that may make it possible to non-destructively test wire bond quality in real-time during automated wire bonding? See Laura Peters' "Wire Bond Tester Targets Zero Field Failures." You can find all of these articles here under the "Editor's Picks." Also, remember you can find more advanced packaging news and events on our Semiconductor Packaging Technology Channel:

www.semiconductor.net/packaging

Sally Cole Johnson, Contributing Editor
scolejohnson@mac.com

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NEWS

New Packaging Technologies Dominate Best of West Awards
Thomas Morrow, Vice President of Global Expositions and Marketing, SEMI, San Jose — Semiconductor International, 7/11/2008

Underscoring the degree of innovation occurring in semiconductor packaging, four of the eight finalists in the Best of West awards were new packaging technologies — three of these serve in 3-D IC applications. More

SUSS MicroTec Unveils 300 mm Mask Aligner for 3-D Packaging
Business Wire, 7/15/2008

At SEMICON West 2008, SUSS MicroTec unveiled the second generation of its MA300 production mask aligner, featuring a dedicated alignment kit for creating 3-D interconnects for applications like chip stacking and 3-D image sensor packaging. More

EV Group Supplies TSV Equipment to STMicroelectronics
PR Newswire, 7/8/2008

EV Group has received a major multi-million-euro order from STMicroelectronics for its 300 mm bonding, alignment and photoresist processing tools. EVG's fully automated tools were successfully installed at STMicro's 300 mm through-silicon via (TSV) pilot line in Crolles, France, and are used in the manufacture of CMOS imaging sensors. More

Gartner Cuts Semi Equipment Forecast to -22.4%
Ann Steffora Mutschler, Senior Editor — Electronic News, 7/10/2008

Heading grimly into the semiconductor manufacturing equipment industry's biggest tradeshow and conference, SEMICON West, market research company Gartner Inc. has cut its semiconductor capital spending forecast by an additional 2.6%, projecting a 22.4% decline for 2008, with little upside potential currently visible for the near-term given that all segments of the semiconductor manufacturing equipment market are reporting decreased spending plans, coupled with an anticipated bursting of the capital spending bubble in memory markets, as well as continued uncertainty in the global economic picture. More

Aehr Test Systems Receives Order for Burn-In and Test System
PR Newswire, 7/14/2008

Antares and Aehr Test Systems announced that they have agreed to work together to address the establishment of a strategic partnership to jointly pursue the high-power, individual temperature control (ITC), test during burn-in (TDBI) market for packaged devices that dissipate up to 75W per device. More

iNEMI Issues Recommendations for Managing Lead-Free Solder Alloys
Sally Cole Johnson, Contributing Editor — Semiconductor International, 7/10/2008

iNEMI has outlined a set of key approaches to help the electronics industry respond to the many issues and challenges emerging in the manufacturing process as a result of numerous lead-free solder alloy options. More

Nvidia Reports Thermal Issues Caused Packaging Failures
Staff — Semiconductor International, 7/3/2008

Nvidia Corp. said some of its notebook-use graphics chips have failed because of packaging materials that could not withstand the "extreme thermal environments" seen in notebook computers. The company will take a one-time charge of $150M-$200M during its second quarter. More

High-Density Packaging Possibilities
Karl Stuber, Senior Director, Test, Assembly and Packaging, SEMI, San Jose — Semiconductor International, 7/15/2008

A recent analysis of a high-end cell phone found 65 active single and multi-chip packages (MCPs) with I/Os ranging from 2 to 447 pins, with the large majority having <200 I/Os. Mobile device manufacturers today are incorporating more than 30 wafer-level chip-scale packages (WLCSPs) into their high-end cell phones. More

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Thru-Silicon-Via (TSV) Foundry Services
ALLVIA, Inc. provides Thru-Silicon Via foundry services to MEMS and Semiconductor Industries meeting the demands of advanced vertical interconnects and System-in-Package (SiP) solutions. Through Silicon Vias provide the shortest electrical path between two sides of silicon die, allow miniaturization through 3D stacking, and support wafer level packaging (WLP) for RF and MEMS devices. With a full line of in-house processing equipment, ALLVIA offers services for prototyping as well as volume production runs.
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EDITOR'S PICKS

Amkor Unveils High-Performance Flip-Chip Packaging Technology
Sally Cole Johnson, Contributing Editor — Semiconductor International, 7/14/2008

Responding to an industry shift toward thinner substrates to improve signal integrity and electrical performance, Amkor Technology Inc. (Chandler, Ariz.) has developed a flip-chip molded ball grid array (FCMBGA) that uses a molded underfill (MUF) rather than a capillary underfill (CUF) — enabling the much-coveted closer spacing between passives and the flip-chip die, better warpage control for thin-core substrates and improved solder joint reliability for passives. More

Why 3-D TSV is Hotter Than Hot
E. Jan Vardaman, President, TechSearch International Inc., Austin, Texas — Semiconductor International, 7/11/2008

Through-silicon via (TSV) is a technology that allows devices to be placed and wired in 3-D. The adoption of 3-D TSV technology promises higher clock rates, lower power dissipation, and higher integration density. The technology will be adopted in many applications because it solves issues related to electrical performance, memory latency, power and noise — on and off the chip. More

Wire Bond Tester Targets Zero Field Failures
Laura Peters, Editor-in-Chief — Semiconductor International, 7/15/2008

It may soon be possible to non-destructively test wire bond quality in real time during automated wire bonding and "bin" the failures, as is possible in electrical test. A new product from Hesse & Knipps GmbH (Paderborn, Germany), PiQC, is designed to test the quality of wire bonds and use real-time signals during bonding to selectively rate bond quality according to an index. As explained by Roberto Gilardoni, sales engineer at Hesse & Knipps GmbH, during the IMAPS Advanced Technology Workshop on Wire Bonding held in conjunction with SEMICON West, even the best bonders cannot account for bad bonds due to substrate contamination, clamping problems or “human factor” issues that occur in a production environment. More

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PRODUCTS</ B>

Wafer Bonding Platform

The Gemini platform is a field-proven, production manufacturing solution for high-volume wafer bonding applications for MEMS, 3-D integration and advanced packaging, as well as compound semiconductor applications. The tool is for 300 mm wafers and incorporates SmartView bond alignment principle, as well as up to four wafer bond chambers that can achieve post-bond alignment accuracies in the submicron range.
EV Group, St. Florian, Germany
More

Sputter Deposition System

Apollo is a high-volume manufacturing tool designed for advanced wafer-level packaging. Three chambers under vacuum can operate in parallel, allowing three batches of wafers to be simultaneously processed. Apollo handles wafer sizes from 100 to 300 mm ranging in thickness from 100 µm to 2 mm.
NEXX Systems Inc., Billerica, Mass.
More

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Through-Silicon Vias: Ready for Prime Time?
In this on demand webcast, a panel of experts discuss the various etch, deposition and plating processes required for fabricating TSVs, focusing on unsolved manufacturability challenges. Panelists include: Philip Garrou of Microelectronic Consultants of NC, Jan Vardaman of TechSearch International, and Fred Roozeboom of NXP Semiconductors.
View now!

Sponsored by: ECI Technology, Surface Technology Systems & ALLVIA, Inc.

UPCOMING EVENTS

July 28-31, 2008: ICEPT-HDP 2008

Aug. 3-4, 2008: Packaging Technology

Aug. 5-7, 2008: Packaging Design

Sept. 7-10, 2008: 2008 KGD Packaging & Test Workshop

Copyright 2008 Reed Business Information, a division of Reed Elsevier Inc. All Rights Reserved.
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