April 25, 2008
IN THIS EDITION
NEWS
 
» Air Gaps: Unlikely Becoming More Likely?
» IBM: 'Open For Business' for 32 nm High-k/Metal Gate Designs
» VLSI Symposium Takes on Nanowires, FinFETs, High-k/Metal Gate
» Aviza Announces Major Restructuring
» Chartered Extends Technology Development With IBM to 22 nm
» Lam Records $65.8M Charge for Stock-Option Backdating
» Applied Targets Mask Cleaning
EDITOR'S PICKS
 
» Webcast: Wafer Cleaning Solutions for 45 and 32 nm
» Solid-Source Delivery System Enables Hafnium-Based Gate Dielectrics
» Trends in Shallow Junction Engineering
» High-k Metal Gate Has Scalability, Implementation Issues
PRODUCTS
 
» Single-Wafer Ion Implanter
» Metal Stripping Tool
» ALD Precursor Delivery System
UPCOMING EVENTS
 
Dear Subscriber,

You've heard it before but we'll say it again — much of the excitement in devices today occurs at the transistor level. This month we examine the options behind high-k and metal gate, ways of fabricating ultrashallow junctions, and methods for cleaning the residues left behind various processes without sacrificing precious silicon. Remember that you can always find other useful information at our Wafer Processing Technology Channel:

www.semiconductor.net/wafer

Laura Peters, Editor-in-Chief
lpeters@reedbusiness.com

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NEWS

Air Gaps: Unlikely Becoming More Likely?
Laura Peters, Editor-in-Chief — Semiconductor International, 4/23/2008

The upcoming International Interconnect Technology Conference (IITC), held in Burlingame, Calif., June 1-4, will once again feature papers on the use of air gaps as a low-k dielectric. But unlike the papers of years ago, air gaps seem to be emerging out of the pure research phase, becoming possible, even likely, to one day be used in production devices. Two companies propose sacrificial approaches to air gap formation in the pre-conference material. Toshiba (Tokyo) builds a 10 metal level interconnect with sacrificial polyarylene (PAr) interlevel dielectric. STMicroelectronics and CEA-Leti researchers in Grenoble, France, will also report on the use of a sacrificial material, SiO2, which is removed using hydrofluoric acid (HF). More

IBM: 'Open For Business' for 32 nm High-k/Metal Gate Designs
David Lammers, News Editor — Semiconductor International, 4/14/2008

IBM Corp. (Armonk, N.Y.) and its partners are "open for business" for early customer design engagements using a bulk 32 nm technology with a high-k/metal gate stack, said Gary Patton, an IBM vice president. IBM announced that a low-power 32 nm design enablement package is now available, with a design prototyping shuttle starting in the third quarter of 2008 and continuing on a quarterly schedule. More

VLSI Symposium Takes on Nanowires, FinFETs, High-k/Metal Gate
David Lammers, News Editor — Semiconductor International, 4/1/2008

The 2008 VLSI Technology Symposium, planned for June 17-19 in Honolulu, kicks off with an appropriate beginning for an industry with a keen interest in renewable energy, and then takes up high-k dielectrics, nanowires, vertical devices and other topics on the semiconductor industry's research agenda. More

Aviza Announces Major Restructuring
Staff — Semiconductor International, 4/3/2008

Aviza Technology Inc. (Scotts Valley, Calif.) stated it will undergo a "significant restructuring" of its global workforce and products, focusing on atomic layer deposition (ALD), as well as etch and physical vapor deposition (PVD) technologies for the fast-growing MEMS, 3-D IC and power semiconductor markets. More

Chartered Extends Technology Development With IBM to 22 nm
Business Wire, 4/2/2008

Chartered Semiconductor Manufacturing announced the extension of its joint development collaboration with IBM to include 22 nm bulk CMOS. Financial terms were not disclosed. More

Lam Records $65.8M Charge for Stock-Option Backdating
Ann Steffora Mutschler, Senior Editor — Electronic News, 4/1/2008

The semiconductor manufacturing equipment supplier has recorded adjustments to previously issued financial statements totaling $65.8M for compensation expenses, net of taxes, in fiscal years 1997-2006, with a $3M impact on the three most recent fiscal years. More

Applied Targets Mask Cleaning
Business Wire, 4/14/2008

Applied Materials Inc. released its Applied Tetra Reticle Clean, a wet clean system designed to deliver damage-free, >99% particle removal efficiency for 32 nm photomasks. According to the company, the compact Tetra Reticle Clean system offers up to four times the throughput of competing systems. More

Advertisement
On Demand: Wafer Cleaning Solutions for 45 and 32 nm
Recorded as a live panel at Sematech's SPCC in Austin, Texas, this on demand webcast focuses on FEOL wafer cleaning and photoresist strip challenges and solutions for the 45 and 32 nm device generations. Panelists include: Jeffrey Butterbaugh, FSI International; Anthony Muscat, University of Arizona; D. Martin Knotter, NXP Semiconductors; Brian Kirkpatrick, Texas Instruments.
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Sponsored by: IDEX Health & Science Group

EDITOR'S PICKS

Webcast: Wafer Cleaning Solutions for 45 and 32 nm
Moderated by Aaron Hand, Executive Editor, Electronic Media — Semiconductor International, 4/15/2008

Recorded as a live panel at Sematech's 2008 Surface Preparation and Cleaning Conference (SPCC) in Austin, Texas, the discussion focused on front-end-of-line (FEOL) wafer cleaning and photoresist strip challenges and solutions for the 45 and 32 nm device generations. The speakers were Brian Kirkpatrick, Senior Member of Technical Staff, Texas Instruments; D. Martin Knotter, Senior Principal Scientist, NXP Semiconductors; Anthony Muscat, University of Arizona; and Jeffrey Butterbaugh, Chairman, ITRS Front End Processes. View

Solid-Source Delivery System Enables Hafnium-Based Gate Dielectrics
Mohith Verghese, ASM America Inc., Phoenix; Scott Battle and Jeff Roeder, ATMI Inc., Danbury, Conn. — Semiconductor International, 4/1/2008

High-k/metal gate requires new process technologies, precursors and delivery techniques to enable volume production of hafnium-based gate dielectrics. ALD has facilitated new gate material use while maintaining the potential to scale transistor geometry. More

Trends in Shallow Junction Engineering
Ruth DeJule, Contributing Editor — Semiconductor International, 4/1/2008

Chipmakers and equipment manufacturers alike are developing new techniques and integrating processes to meet stringent ITRS requirements for shallower junction depths. More

High-k Metal Gate Has Scalability, Implementation Issues
Alexander Braun, Senior Editor — Semiconductor International, 04/1/2008

We spoke with Raj Jammy, an IBM assignee working at Sematech as director of the Front End Processes Division. In this interview, he presents many of the materials and design hurdles facing the implementation of high-k/metal gates beyond the 32 nm generation. Listen

Advertisement
Through-Silicon Vias: Ready for Prime Time?
In this on demand webcast, a panel of experts discuss the various etch, deposition and plating processes required for fabricating TSVs, focusing on unsolved manufacturability challenges. Panelists include: Philip Garrou of Microelectronic Consultants of NC, Jan Vardaman of TechSearch International, and Fred Roozeboom of NXP Semiconductors.
View now!

Sponsored by: ECI Technology, Surface Technology Systems & ALLVIA, Inc.

PRODUCTS

Single-Wafer Ion Implanter

Optima XE is a high-energy ion implanter for DRAM, NAND and NOR flash, embedded memory and logic device manufacturing. It provides a complete range of energy levels from 10 keV to 4 MeV.
Axcelis Technologies Inc., Beverly, Mass.
More

Metal Stripping Tool

ViPR technology has been adapted to successfully remove unreacted metal films after salicide formation. By implementing this new process, IC makers can achieve dramatic reductions in chemical usage and capital requirements for cobalt, nickel and nickel platinum silicide integration schemes.
FSI International Inc., Minneapolis
More

ALD Precursor Delivery System

Mole Delivery Device (MDD) is an ALD precursor delivery and control technology that uses fundamental gas measurement principles and application-specific control valves. The MDD is able to precisely deliver liquids, as well as dissolved solid precursors and gases with low volatility.
MKS Instruments, Andover, Mass.
More

UPCOMING EVENTS

May 5-7, 2008: SEMICON Singapore

May 5-7, 2008: Advanced Semiconductor Manufacturing Conference

May 8-9, 2008: S2K 2008

Copyright 2008 Reed Business Information, a division of Reed Elsevier Inc. All Rights Reserved.
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