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February 20, 2008 |
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IN THIS EDITION |
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NEWS |
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EDITOR'S PICK |
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PRODUCTS |
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UPCOMING EVENTS |
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Dear Subscriber,
IMAPS' International Device Packaging Conference and Exhibition is coming up quick, with an itinerary that includes a focused forum on the latest technology in microelectronics packaging. The topics that will be covered during this forum are flip-chip, wafer-level chip-scale packaging, 3-D packaging, MEMS, biomedical packaging and more. In Phil Garrou's latest post to his Perspectives From the Leading Edge blog (see Editor's Pick below), he talks about one particular 3-D presentation he's looking forward to. For more news and events, please visit our Semiconductor Packaging Technology Channel:
www.semiconductor.net/packaging
Sally Cole Johnson, Contributing Editor
scolejohnson@mac.com |
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| Thru-Silicon-Via (TSV) Foundry Services |
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Rudolph Technologies Joins Sematech Metrology Program
Staff — Semiconductor International, 2/20/2008
Rudolph Technologies Inc. joined the Sematech metrology program, which is based in Albany, N.Y. Rudolph and Sematech will jointly establish an International Process Characterization (IPC) program aimed at measuring thin films, metal gate stacks and other 32 nm and beyond inspection challenges, including inspection and metrology for through-silicon vias (TSVs) and 3-D ICs. More |
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New York Backs SRC Interconnect Consortium at Albany
Business Wire, 02/18/2008
Semiconductor Research Corp. (SRC) announced that the College of Nanoscale Science and Engineering (CNSE) of the University at Albany will serve as headquarters for a comprehensive research effort aimed at enabling nanoelectronics advances that are critical for the development of smaller, faster and cheaper computer nanochips amid the approaching limits of interconnect scaling. More |
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Stanford Researchers Demonstrate GHz-Speed CNT Interconnects
David Lammers, News Editor — Semiconductor International, 2/16/2008
Researchers at Stanford University have developed a method of placing multi-walled carbon nanotubes as wires, with gigahertz-level interconnect performance observed for the first time. More |
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Amkor Reports Strong Fourth Quarter 2007 Results
Business Wire, 02/13/2008
Amkor Technology Inc. reported its financial results for the fourth quarter and year ended Dec. 31, 2007. Net sales of $747M for the fourth quarter of 2007 were up 8.4% from the third quarter of 2007 and up 9.4% from the fourth quarter of 2006. Fourth quarter net income was $94M, up 54.5% from the third quarter of 2007 and 58.6% from the fourth quarter of 2006. Fourth quarter earnings per diluted share was $0.46, up 53.3% from $0.30 in both the third quarter of 2007 and fourth quarter of 2006. More |
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Survey: China's IC Industry Growing Fast
Yao Gang, Editor-in-Chief, SI China — Semiconductor International, 2/16/2008
The IC industry in China is growing rapidly, with 2008 IC sales expected to grow by 31.3% this year, according to a survey by the Shanghai Integrated Circuit Industry Association. In Shanghai, packaging and test accounts for half of the metropolitan region's semiconductor revenues, according to the survey. More |
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Georgia Tech Orders Pegasus System for New Nanotechnology Research Center
PR Newswire, 02/20/2008
Surface Technology Systems plc (STS) announced that they have sold a Pegasus deep reactive ion etch (DRIE) tool to the Georgia Institute of Technology (Atlanta), the first U.S. university to order the latest generation of STS' Advanced Silicon Etch (ASE) systems. This equipment will eventually be sited in the Institute's new Nanotechnology Research Center Building (NRCB), which is due for completion in fall 2008. More |
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SEMI Publishes Eight New Technical Standards
PR Newswire, 02/12/2008
SEMI has published eight new technical standards applicable to the semiconductor, flat panel display (FPD) and MEMS manufacturing industries. The new standards, developed by technical experts from equipment and materials suppliers, device manufacturers and other companies participating in the SEMI International Standards Program, are available for purchase in CD-ROM format or can be downloaded from the SEMI website. More |
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| Asymtek Spectrum S-920N, Scalable, Higher
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Scalable dispensing platforms give low cost of
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A Rapid Response Heater™ and Controlled Process Heat
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plus reduced start-up and ramp time. Click here!
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High-Throughput Laser Drilling for 3-D IC TSVs
Phil Garrou, Contributing Editor — Semiconductor International, 02/17/2008
There will be a major presentation by XSil at the upcoming IMAPS Device Packaging meeting, to be held March 17-20 in Scottsdale, Ariz. In keeping with Semiconductor International's goal of getting you all of the leading-edge 3-D information as soon as possible, I'll give you a taste of what to expect...." Blog |
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Advertisement |
| 2008 Semiconductor Industry Forecast On Demand Webcast |
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This webcast brings together several key industry analysts to debate the semiconductor industry outlook for 2008 and give us their perspectives on application drivers, geographical influences, changes in the memory market and more. View Now!
Sponsored by: SAP
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FIB Backside Edit
A field-upgradeable option to add backside circuit edit capabilities to the V600CE FIB system is now available. It adds an IR camera and bulk silicon trenching capabilities, supporting flip-chip and traditionally packaged semiconductor devices.
FEI Co., Hillsboro, Ore.
More |
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Microscopy Series
The alpha500 and alpha700 microscopy series was designed for automated confocal Raman imaging and atomic force microscopy (AFM) on large samples. The series combines 3-D chemical imaging and AFM for high-resolution structural imaging in an automated system.
WITec GmbH, Ulm, Germany
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Advertisement |
| Highlights of the 2007 ITRS On Demand Webcast |
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In this webcast, Alan Allan, Intel External Programs Staff Engineer and member of the IRC, explains the important changes relative to past years and significant additions to the roadmap. He is then joined by the chairmen of several of the key technology working groups to answer questions from the audience. View Now!
Sponsored by: TEL and Particle Measuring Systems
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Feb. 28, 2008: Thermal Solutions for Advancing Technology
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March 9-12, 2008: Burn-In and Test Socket Workshop
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March 11-12, 2008: 3-D All Silicon System Module
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March 13, 2008: Workshop on Wafer-Level MEMS Testing
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March 17-20, 2008: International Device Packaging Conference and Exhibition
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