The latest information on semiconductor packaging including wafer-level and chip-scale 3-D integration, wafer bumping, die and wire bonding, and encapsulation.
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IMEC, Synopsys to Co-Develop 3-D Stacked ICs
Staff, March 9, 2010IMEC will use Synopsys TCAD tools in a collaboration to address reliability and performance concerns in through-silicon via (TSV) technology. More -
Gartner Sees ‘Spurt' in Capex Spending
Staff, March 8, 2010Gartner said wafer fab equipment and packaging and assembly equipment both will see ~76% growth this year, led by memory companies making the technology transition to DDR3 DRAMs. Capex may slow down slightly later this year before picking up again going into 2011, analyst Jim Walker said. More -
Embedded Die Technology Gains Support
Sally Cole Johnson, Contributing Editor, March 3, 2010
Embedded die technology is heading for volume production and may give fan-in wafer-level packaging a run for its money, predicts Yole Développement analyst Jerôme Baron. "Embedding dies into PCB laminates is another key piece of the widening 3-D packaging toolbox," Baron said. More
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3-D Interconnects Shape Future Solutions
Philip Garrou, Contributing Editor, Microelectronic Consultants of NC, February 16, 2010
An IEEE meeting in Santa Clara, Calif., attracted several leaders of 3-D IC technology development, who presented a list of challenges to the TSV-creation infrastructure. More
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Fan-Out Packaging Dispute Resolves in IP Licensing Deal
Sally Cole Johnson, Contributing Editor, February 3, 2010
What began as a patent dispute over fan-out packaging technologies has resulted in an IP agreement that will ultimately make it easier for packaging subcontractors to license Epic's ChipsFirst and Freescale's RCP technologies in one step, said James Kohl, Epic's CEO. More
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Driving Down the Cost of TSVs
Sally Cole Johnson, Contributing Editor, February 1, 2010The race to drive down the cost of through-silicon vias (TSVs) is on, with new cost targets in clear view. Industry efforts are moving TSVs beyond the latest 'marketing hype' to a legitimate optional packaging method. More -
TI Boosts Spending on Assembly and RFAB
David Lammers, News Editor, January 27, 2010
With demand strong for computer power ICs, LED TV backlight controllers and other analog products, Texas Instruments is expanding test and assembly capacity to meet customer delivery agreements. Also, a pilot line at the new 300 mm analog RFAB is up and running, and TI expects full production there by the end of the year. More
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Allvia Offers New TSV Reliability Data
Sally Cole Johnson, January 25, 2010
Allvia is stepping forward with details about its full reliability tests, and the data may help customers decide which products are feasible, said CEO Sergey Savastiouk. To avoid CTE issues, Allvia uses a silicon interposer between two stacked substrates and connects them with TSVs. "Our target is to add passive elements on the substrate," he said. More
News from the Web
I-Micronews - POWER ELECTRONICS : Clare introduces first high-voltage, high-side gate driver...
Date: 14 hours 54 minutes 33 seconds ago.Power ICs/Fairchild Semiconductor's PowerTrench® N-Channel WL-CSP MOSFETs Save Battery Life, Board Space in Portable Applications
Source: www.electronicspecifier.com
Date: 03-12-2010 00:00:00 GMTIXYS Introduces 600V, High-Side Gate Driver IC for Power MOSFETs and IGBTs
Source: www10.EDACafe.com
Date: 03-09-2010 21:32:04 GMTAries Ingenieria Y Sistemas Secures Financing For CSP Plant
Source: www.solarindustrymag.com
Date: 03-11-2010 16:30:53 GMTFairchild Semiconductor's PowerTrench® N-Channel WL-CSP MOSFETs Save Battery Life, Board Space in Portable Applications (Business Wire)
Source: finance.yahoo.com
Date: 03-11-2010 16:00:00 GMT
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Perspectives From the Leading Edge
November 20, 2009
3D News: Applied/Semitool, TSMC, Ziptronix
Applied By now we have all seen the headlines that Applied Materials has acquired...
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Perspectives From the Leading Edge
November 17, 2009
RTI 3D ASIP, Aviza, Jenoptik Laser Dicing
RTI 3D ASIP It was 2004 when RTI held its first 3D conference, long before 3D...
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Perspectives From the Leading Edge
November 6, 2009
Taiwanese Focus on 3D IC
PFTLE recently covered 3D activities at ITRI (see PFTLE, “3D IC at...
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Perspectives From the Leading Edge
August 22, 2009
Semicon TechXPOTs
Semicon West scheduled a series of TechXPOTs during the show that were actually...
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None of the pictures are...
P H– 3/9/2010 11:08:35 AM CST
in response to Deep Silicon Etching Gets Ready for 3-D ICsNice summary. This was an extremely informative meeting and I'm very glad to see...
Dean Stevens– 2/19/2010 6:34:31 PM CST
in response to 3-D Interconnects Shape Future SolutionsDear sir,This paper helps me to understand bonding wires in some details. I am...
Zhunming Du– 2/4/2010 4:53:19 PM CST
in response to Performance Comparison of Gold vs. Copper Wire BondingBest Quality Guarantee, Cheap...
Rolex– 1/14/2010 11:29:37 PM CST
in response to GlobalFoundries Adds Qualcomm, Supports Gate-First Technology at 28 nm Generation
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Technical Articles
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Driving Down the Cost of TSVs
Sally Cole Johnson, Contributing Editor 02/01/10The race to drive down the cost of through-silicon vias (TSVs) is on, with new cost targets in clear view. Industry efforts are moving TSVs beyond the latest 'marketing hype' to a legitimate optional packaging method. -
Reversing the Electronic Assembly Process
Joseph Fjelstad, Verdant Electronics, Cupertino, Calif. 12/01/09By reversing the electronic assembly process, it's possible to eliminate solder and cut waste. The Occam process is a simplified approach that is reliable and cost-effective. -
Encoders Provide Path to High-Resolution Positioning
Wolfgang Holzapfel, Dr. Johannes Heidenhain GmbH, Traunrent, Germany 09/01/09High-resolution interferential encoders, when chosen, calibrated and used appropriately, are instrumental to the positioning performance of steppers, inspection tools and dicing machines.
Events
ISQED 2010
March 22-24, 2010Location: DoubleTree HotelSematech Surface Preparation & Cleaning Conference
March 22-24, 2010Location: Sheraton Austin HotelEuroSimE
April 26-28, 2010Location: Mercure Cite Mondiale


