New products for semiconductor manufacturing, including semiconductor capital equipment, materials, and equipment components and subsystems.
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GaN MOCVD System
Staff, February 1, 2010The TurboDisc K465i GaN MOCVD system produces high-brightness LEDs. Based on the company's K-Series platform, the system can achieve LED yields approaching 90% in a 5 nm bin. It uses the company's Uniform FlowFlange technology, which provides ease-of-tuning for fast process optimization on wafer sizes up to 8 in. More -
XRF Yield Management Tool
Staff, February 1, 2010The System SMX-Remote static head ILH is an atmospheric in-line X-ray fluorescence (XRF) metrology tool platform that provides composition and thickness measurements for thin-film solar PV metal film stacks on flexible roll-to-roll substrates such as stainless steel, aluminum and polyimide or rigid substrates. More -
Continuous Level Transmitter
Staff, February 1, 2010The MC1000 is a continuous level measurement device that can be used as a standalone product or as an option on the company's 810 Magnetic Level Gauge (MLG) series. Made of either 316SS, PVC or PVDF, it comes with either flanged or threaded tank connections providing flexible mounting options. It features a two-wire 4–20 mA interface and an available HART interface option. More -
Modular Gas Standards Generator
Staff, February 1, 2010The FlexStream modular gas standards generating system offers flexibility to create precision gas mixtures. The system dilutes the emission from permeation or diffusion tubes with an inert gas, typically nitrogen or zero air, to create trace concentration — ppm, ppb and ppt — mixtures. More -
Silane-Free Coatings
Staff, February 1, 2010Silexium is a silane-free antireflective passivation coating that nearly eliminates light-induced degradation (LID) in solar cells. With appropriate process optimization, solar cells coated with the films deliver net efficiency gains to existing production lines. More -
Optical PV Cell Testing System
Staff, February 1, 2010The QDI 2010 PV solution combines advanced microspectroscopy with software to measure transmissivity, reflectivity and luminescence of many of the components used to manufacture PV cells such as concentrators. It will also determine the thin-film thickness by either transmission or reflectance of many types of materials and substrates. More -
Ultrasonic Flow Meters
Staff, February 1, 2010Leviflow LFS-04 and LFS-08 are two 3/8 in. ultrasonic flow meters for non-invasive measurement of liquid flow rates from 50 mL/min to 8 L/min. All fluid contacting parts are made of ultrapure PFA and meet the requirements of single-wafer cleaning tools. The sensors and the DSP-based electronic controller are compact and versatile. More -
CMP Platform
Staff, February 1, 2010The Reflexion GT system for advanced metal CMP applications provides dual-wafer design and delivers enhanced profile control and higher throughput. It also cuts consumables cost, requiring up to 30% less slurry and processing twice as many wafers per polishing pad. More
News from the Web
SiGe - First silicon-based high-power 2GHz 802.11bgn WLAN power amplifier
Source: www.electropages.com
Date: 3 hours 19 minutes 30 seconds ago.Aehr Test Systems Schedules Third Quarter Fiscal Year 2010 Earnings Release and Conference Call
Source: www.prnewswire.com
Date: 6 hours 35 minutes 18 seconds ago.Industrial Nanotech CEO and Saudi Arabia's Prominent Leaders to Meet in March
Source: www.azonano.com
Date: 8 hours 7 minutes 29 seconds ago.Semiconductor Recovery in 2010 More Modest Than it Appears | EMAsiaMag.com
Source: www.emasiamag.com
Date: 8 hours 17 minutes 59 seconds ago.TierLogic Launches 3D FPGAs
Source: Electronics Weekly
Date: 8 hours 56 minutes 18 seconds ago.
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Standalone Pushes Optical CD Boundaries
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SEM Enables Rapid Subnanometer 3-D Surface Imaging
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A Modest Proposal
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Testing Equipment Rental– 8/24/2009 7:16:45 AM CDT
in response to Wafer-Level RF TestingGreat idea, but it'll never happen....
Bill Fernald– 9/16/2008 6:21:00 PM CDT
in response to A Modest ProposalGo Nova. But watch out, following KLA's pass strategy, it willacquire you...
Sameul– 8/1/2008 4:54:00 PM CDT
in response to Standalone Pushes Optical CD BoundariesThis product looks very interesting. Its speed is impressive.Clearly its...
Paul– 7/25/2008 4:09:00 AM CDT
in response to Standalone Pushes Optical CD Boundaries
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Technical Articles
-
GaN MOCVD System
Staff 02/01/10The TurboDisc K465i GaN MOCVD system produces high-brightness LEDs. Based on the company's K-Series platform, the system can achieve LED yields approaching 90% in a 5 nm bin. It uses the company's Uniform FlowFlange technology, which provides ease-of-tuning for fast process optimization on wafer sizes up to 8 in. -
XRF Yield Management Tool
Staff 02/01/10The System SMX-Remote static head ILH is an atmospheric in-line X-ray fluorescence (XRF) metrology tool platform that provides composition and thickness measurements for thin-film solar PV metal film stacks on flexible roll-to-roll substrates such as stainless steel, aluminum and polyimide or rigid substrates. -
Continuous Level Transmitter
Staff 02/01/10The MC1000 is a continuous level measurement device that can be used as a standalone product or as an option on the company's 810 Magnetic Level Gauge (MLG) series. Made of either 316SS, PVC or PVDF, it comes with either flanged or threaded tank connections providing flexible mounting options. It features a two-wire 4–20 mA interface and an available HART interface option.
Events
SEMATECH Surface Preparation and Cleaning Conference
February 18-28, 2010Location: 701 East 11th StreetDevice Packaging
March 08-11, 2010Location: --Sematech Surface Preparation & Cleaning Conference
March 22-24, 2010Location: Sheraton Austin Hotel



