Link This |
Email this |
Blog This |
Comments (1)
An Estimate of Metrologists
April 10, 2008
Author James Lipton spent the better part of two decades researching and accumulating “nouns of multitude,” which are used to describe the gathering of commonplace or exotic creatures, such as a litter of puppies, a pride of lions, or a knot of toads. His book, An Exaltation of Larks, is not only a fun read, but will also make you sound so highly educated that your best friends will avoid you.
I herewith contribute one more for his collection: An Estimate of Metrologists… surely the most exotic of all creatures!
By way of this rather convoluted opening I want to pass to you a message from my friends at NIST and remind you that you’re still in time to participate as a presenter in what I consider the premier metrology conference on characterization and metrology — and not just because I’m a committee member or because SI is the sponsoring publication! — the 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics conference. The event, which is held every two years, will take place at the College of Nanoscale Science & Engineering, University at Albany, New York, from May 11 to 14, 2009.
If keeping up with the latest goings-on in the areas of metrology and characterization (particularly as these pertain to nanoelectronics) interests you, this is one event you’d probably not want to miss. Recognized leaders in the various facets of the Dark Art of Metrology will talk about their ongoing research, and you’ll have the opportunity to corner and question them to exhaustion. If, for some unforgivable reason you can’t attend, the American Institute of Physics will publish the conference proceedings in book form, with a CD-ROM version for those for whom bookshelf space is at a premium.
If you are interested in submitting an abstract for a contributed poster paper, describing your work in nanoelectronics, you’ll find all the necessary information at the conference site. Should you need extra incentive, there will be a $2500 cash award for the best metrology paper. You have until December 17 of this year to send in your abstract. If you have a suggestion for an invited presentation you can contact directly David Seiler, chief of NIST’s Semiconductor Electronics Division.
Some—but definitely not all—of the subjects scheduled to be covered at next year’s event are: alternative gate dielectrics, beyond CMOS, breakthroughs in electron microscopy, breakthroughs in lithography, channel Engineering (for instance, strained silicon, III-Vs), critical analytical techniques, defects, integrated metrology, present and future interconnects, MEMS/NEMS metrology applications, nanoelectronic materials and devices, novel measurement methods, and many, many others.
The conference has an impressive list of sponsors: the National Institute of Standards and Technology (NIST); the College of Nanoscale Science & Engineering, University at Albany; Semiconductor Equipment and Materials International (SEMI); the Semiconductor Research Corporation (SRC); International SEMATECH Manufacturing Initiative; Semiconductor International; the National Science Foundation (NSF); the American Physical Society (APS); and the American Vacuum Society (AVS).
Hope to see you at this next great estimate of metrologists!
Posted by Alexander E. Braun on April 10, 2008 | Comments (1)
