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ArchivesA Modest ProposalPosted by Alexander E. Braun on May 13, 2008
For decades now, there has been a desperate wringing of hands and loud, roaring noises of sadness and despair over the fact that we are losing our technical infrastructure because companies are migrating to other countries, attracted by more genial business climates, mostly due to those nations’ lower labor costs and their governments’ economic breaks, offered to almost any company willing to move its means of production there. There have been very strong complaints on our side, but very little has been done. Yes, Congress shows deep co...Read More Industries: Business/Market, Inspection, Measurement & Test, New Products, Photovoltaics, Related Industries Revisiting a Conference and Some Ongoing ProblemsPosted by Alexander E. Braun on May 9, 2008
Industries: Fab Facilities, Inspection, Measurement & Test, Lithography, New Products, Related Industries, Wafer Processing, Yield Management IP Theft: Innovation at RiskPosted by Alexander E. Braun on April 23, 2008
Industries: Business/Market, Fab Facilities, Inspection, Measurement & Test, Lithography, Materials, Nanotechnology, Photovoltaics, Related Industries, Wafer Processing Aerial Imaging Simplifies Mask InspectionPosted by Alexander E. Braun on April 15, 2008
Mask inspection certainly has not been made any easier by the continuing complexity being designed into masks to enable them to print the desired features on the wafer. Low k1 lithography, for example, requires aggressive OPCs, phase-shift masks, combined with extreme off-axis illumination. These and other factors have combined to create major inspection hurdles. Each generation of photomasks incorporates increasingly sophisticated resolution enhancement techniques that reduce the correlation between the pattern on the mask and that on the printed wafer. This can present a problem for traditional inspection systems because they can only produce an image of the mask itself, and it has been a while since there was a connec...Read More An Estimate of MetrologistsPosted by Alexander E. Braun on April 10, 2008
Author James Lipton spent the better part of two decades researching and accumulating “nouns of multitude,” which are used to describe the gathering of commonplace or exotic creatures, such as a litter of puppies, a pride of lions, or a knot of toads. His book, ...Read More Photovoltaics: An Alternative OpinionPosted by Alexander E. Braun on April 4, 2008
Metrology: Where's the Added Value?Posted by Alexander E. Braun on March 27, 2008
Below is the first of what I hope will be innumerable postings. Just so you’ll know what to expect, I plan to focus and comment on metrology issues and developments in the fields of inspection, measurement, test, and standards. Unless you are a metrologist, actually working to produce these measurement tools or standards, the all-pervading effect that metrology has across industries and professions, such as nanotechnology, engineering, semiconductor processing, materials, and everywhere across our global industry is extremely difficult to factor. I shall try to do that here, as well as occasionally growl, grumble, and comment on other matters and subjects that may innocently and foolishly meander too close to my gunsights. I hope that we’ll get to know each other better, and that when you have a comment you won&rsqu...Read More Industries: Inspection, Measurement & Test, Materials, Nanotechnology, Photovoltaics, Related Industries
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