New SIGMA from Carl Zeiss Delivers Affordable Analysis; New class of SEM incorporates unique GEMINI technology

At the Microscopy and Microanalysis Meeting and Exhibition being held in Albuquerque, New Mexico, Carl Zeiss SMT is introducing a new class of SEM: SIGMA. Growing customer demand for ease of use and class leading X-ray and analytical geometry took center stage when the product was developed.

The SIGMA, featuring the unique and proven GEMINI®technology from Carl Zeiss, provides outstanding imaging and analytical results from a field emission microscope with the capability to handle all material types. Material analysis at high resolution is provided by the class leading X-ray geometry for both energy and wavelength dispersive spectroscopy (EDS and WDS).

The SIGMA can handle specimens of up to 250 mm diameter and 145 mm tall. Furthermore, the coplanar chamber design provides the ideal geometry for simultaneous EDS and electron backscattered diffraction (EBSD).

GEMINI®as the market leading Field Emission design, offers unrivalled ease of use, superb low voltage imaging and ultra stable probe currents for analytical applications.

About Carl Zeiss SMT

As the global leader in innovative lithography optics, as well as optical and particle-beam based inspection, analysis and measuring systems, Carl Zeiss SMT opens up new avenues for its customers in industrial manufacturing environments, quality assurance and industrial and academic R&D. Decades of market leadership are based on the success of its leading know-how in light, electron and ion-optical technologies. Together with its subsidiaries in Germany, England, France and the USA, the international group of companies has more than 2,500 employees. In fiscal year 2006/07, Carl Zeiss SMT AG generated revenues of over EUR 1 billion.

Carl Zeiss SMT AG is a wholly owned subsidiary of Carl Zeiss AG. For further information, see: www.smt.zeiss.com .