USC Selects JEOL for New Nano-Imaging Center

Staff -- Semiconductor International, 10/3/2007 12:03:00 PM

JEOL USA (Peabody, Mass.) announced today that the University of Southern California (USC) has purchased three electron microscopes, including a newly introduced SEM-FIB (a dual-column focused ion beam system) for the university’s new Center of Excellence for Nano-Imaging in Los Angeles.

USC is the first U.S. customer to purchase the new JEOL LaB6 MultiBeam, the JIB-4500, high-performance SEM and micromilling FIB. The new lab will also house a JEOL JSM-7001FLV low-vacuum, field-emission scanning electron microscope (FESEM) and a JSM-6490LV low-vacuum tungsten SEM. USC experts in the fields of nanotechnology, biology, materials and engineering will use the new instruments as part of a shared core lab.

USC is expanding research activities through new initiatives in biomedical nanoscience and future fuels and energy. The university’s partnership with JEOL will equip the lab with advanced instrumentation and applications support, and provide a demonstration and training facility that will be a center for advancing knowledge and research for both organizations.

“USC will be considered a strategic center of excellence by JEOL for the purposes of applications development, product planning and training,” said Peter Genovese, vice president and general manager of sales at JEOL USA. “In addition, semi-annual workshops will be held at USC for the purposes of presenting novel and advanced applications of SEM, FIB and cryo-EM. We look forward to the opportunity to work with USC as they conduct advanced research.”

Steve Nutt, professor of materials science and director of the new Center of Excellence for Nano-Imaging, noted, “These machines will comprise the cornerstone of a continuing effort to equip the campus with state-of-the-art instrumentation for imaging and microanalysis. Immediate impact will be felt across disciplines ranging from structural biology to physical sciences and engineering disciplines. A key aspect of the future partnership with JEOL will be the emphasis on developing new applications for the instruments.”