Audio Interview: Test Must Keep Pace With Consumer Devices
Laura Peters, Lead Technical Editor -- Semiconductor International, 6/30/2007
Lead Technical Editor Laura Peters discussed ATE trends with Chetan Desai, vice president and general manager of ATE products for Credence, in preparation for SEMICON West. “The new challenge in the digital domain for DFT is really in the area of the jitter tolerance and assuring the I/O driver integrity as the bus speeds on these devices are growing,” Desai said. “So, in the past, and to a great extent today, the device and its DFT has largely been focused on generating the test data and providing a loop-back path. And they are relying on the tester or the ATE equipment to provide the rest of the capability for jitter injection/jitter tolerance on assurance for quality, and those domains. DFT is going to evolve to tackle these challenges of high-speed buses,” he said.
