Leaders of ATE Industry Meet at First SEMI Test Summit

SEMI, San Jose -- Semiconductor International, 6/1/2007

As semiconductor process technologies shrink to 45 nm and below, test is becoming an indispensable tool in getting high-quality ICs to market in a timely manner. Automated test equipment (ATE) is critical, not just for making pass/fail decisions, but also for obtaining the detailed performance data necessary to fine-tune processes and achieve rapid ramp-up to high yields at production volumes.

Focusing on the growing importance of semiconductor test, SEMI will host the new SEMI Test Summit and Reception at SEMICON West 2007 , Wednesday, July 18, 5:30-7:00 p.m., at the Test, Assembly and Packaging TechXPOT (West Hall, Level Two).

Top executives from leading semiconductor ATE companies (including R. Keith Lee, president and CEO of Advantest; Lavi Lev, CEO and president of Credence; Tim Moriarty, president of Nextest; Mark E. Jagiela, president of the semiconductor test division at Teradyne; and Keith L Barnes, president, CEO and director at Verigy ) will join test authority and moderator Rick Nelson, chief editor of Test and Measurement World , in an industry-critical discussion focused on meeting the design, test and yield requirements for advanced semiconductor manufacturing. The session begins with industry perspective from Intel Test Operation Director, Ashoke Seth, and concludes with a VIP networking reception.

The SEMI Test Summit is free to all registered visitors; however, pre-registration is required. Contact Rebecca Cimaglio-Montoya at rcimagolio-montoya@semi.org for more information, or visit www.semiconwest.org/ProgramsandEvents .