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Could Lithography Remain Ever Optical?

Aaron Hand, Managing Editor -- Semiconductor International, 6/15/2006

Sidebars:
Lithography Executive Viewpoints

As incredible as it is to watch the lithography community to continue — year after year, generation after generation — to come up with increasingly inventive ways to postpone the death of optical lithography, it's also a very natural thing to see. This industry is always likely to stick with the good thing it's got going, especially when it continues to make the most productive and economic sense. At the same time, chipmakers have got to be prepared for the future and, as incredible as it may seem, that future might not include optical lithography — at least not at the most critical device layers.

Sematech held its second Litho Forum recently to update the lithography community about the leading technologies' readiness for the 32 nm half-pitch. With technology advocates from major chipmakers leading the way, presentations were made from throughout the lithography supply chain on the technical progress of extreme ultraviolet lithography (EUVL), 193 nm immersion (193i), next-generation immersion (193i+, with high-index fluids, resists and/or lenses), electron projection lithography (EPL), nanoimprint, and maskless lithography. That may seem like an awful lot of competition for precious development dollars, but some options certainly have broader appeal than others.

One front-runner for 32 nm consideration is EUVL, with chip giant Intel as its clear supporter. The key remaining critical issues to get EUV ready for production, as outlined by Janice Golda, Intel's director of lithography capital equipment development, are resist resolution, sensitivity and line edge roughness (LER); collector lifetime; defect-free masks; and source power. Other remaining issues include reticle protection during storage, handling and use; and the quality and lifetime of projection and illuminator optics. The most significant concern is the timing and cost/business case for EUVL development, she said — a concern echoed in Sematech's post-forum survey by other chipmakers and suppliers, who ranked cost of ownership as the most significant hurdle for EUV.

Nonetheless, significant progress has been made for EUVL. Both ASML and Nikon, which are each preparing full-field exposure tools, presented their progress. At the Microlithography conference in February, ASML demonstrated the printing of 40 nm dense lines/spaces, 60 nm contacts, and 35 nm isolated lines from its alpha EUV tool, which builds on its existing Twinscan platform. For the toolmaker's update last month, contacts had improved to 55 nm, and isolated lines to 30 nm.

Nikon is aiming for the delivery of its first EUV tool in the first half of 2007, having previously developed a small-field tool, and having gained experience with vacuum design through its EPL program. One of the advances focused on by Nikon was a reticle pod developed in cooperation with Canon as a way to minimize contamination without a reticle. The pod has been demonstrated to add an average of 0-0.3 particles per cycle, which is a significant improvement to EUVL reticle handling.

Meanwhile, 193 nm immersion lithography with water, having been put through more tests, has been alternately overcoming previous challenges and discovering new difficulties. But it is the clear preference for the 45 nm generation, and has a shot at the 32 nm half-pitch as well. "Until another technology emerges, this is really the technology to beat for that node," said David Medeiros of IBM, immersion's technical champion at the Litho Forum.

Various organizations have been making encouraging progress in next-generation immersion as well, such as high-index fluids from JSR Micro and DuPont, high-index resists, and extensive study of the suitability of various higher-index lens materials. Among the presentations at the Litho Forum, the University of Queensland described a high-index polymer for resists with an index of refraction >1.9, and Schott Lithotech showed progress in improving the transmission of its high-index lens material, LuAG, which seems to be the most promising lens material candidate for the job. Nevertheless, survey respondents did not seem to place a lot of faith in the feasibility of 193i+ for future generations.

What has been getting a surprising amount of interest is double-exposure lithography — a concept that had previously been shot down as causing too big a hit in cost and productivity, but is now suddenly being revered as the next savior of a reasonably familiar optical world. Although there are still concerns about increased mask costs and throughput, and very little has been shown in the way of actual results, lithographers seem considerably more open to the idea.

A great deal of research and progress has been going on with regard to both nanoimprint lithography and maskless lithography as well, but they are not getting the kind of support (i.e., money) that has been poured into EUVL, for example. And neither option garnered much support in the post-forum survey for 2012 or 2015 production. But global support has become a very critical component in a technology's survival. As imprint developers have pointed out on more than one occasion, all they really need is some large chipmaker to bankroll their infrastructure the way Intel has been financing everything to do with EUVL.

As much as the industry continually tries to narrow down the field of choices for next-generation lithography, smart engineers keep coming up with ideas that are just begging to be taken seriously. And the next thing we know, the field has widened again. Certainly, there's a balance there. While there's a concern that the industry just doesn't have the necessary resources to invest in so many different technologies, nobody wants to disregard out of hand a new idea that could prove to be a boon to productivity and cost savings.

At the same time, new technology introductions are always later than first projected, and the prognosis continues to look good for the extendibility of optical lithography — one way or another. Freescale's Will Conley is fond of referring to what he calls Sturtevant's Law: "The end of optical lithography is always six to seven years away."

TechXPOT: Challenges in Device Scaling

See and hear about innovations in equipment and materials that are extending Moore's Law to the limits of traditional semiconductor manufacturing and beyond.
Tuesday, July 11: Mask Infrastructure Challenges
Photomasks have evolved for what was largely considered a commodity product to become integral to one's lithography strategy, with major economic and technology challenges across the supply chain. How will the industry meet these challenges?
Session Chair: Brian Grenon
11-11:20 a.m.TBA
11:20-11:40 a.m.Toppan, Craig West
11:40 a.m.-12 p.m.Intel IMO, Frank Abboud
12-12:20 p.m.Synopsys, Tracy Weed
12:20-12:40 p.m.KLA-Tencor, Ben Eynon
12:40-1 p.m.Photronics, Speaker TBA
Thursday, July 13: Advanced Metrology — Metrology Challenges for Nanolithography
The drive to higher performance will introduce finer geometries, unusual materials and non-traditional device structures. New and more precise metrology will be required to measure film thickness and composition, CDs, LER, defect density, and topography to ensure proper process control. What is needed? What is available now? What is being developed to meet the needs?
Session Chair: Stephen Knight, NIST
11-11:10 a.m.NIST, Stephen Knight — General Overview
11:10-11:30 a.m.Sematech, Ben Bunday — Overlay and Critical Dimension
11:30-11:50 a.m.TBA — Metrology for Deep Ultraviolet Lithography
11:50 a.m.-12:10 p.m.SUNY Albany, Prof. Greg Denbaugh — EUV Litho Inspection
12:10-1:10 p.m.Panel: Business Climate for Metrology — NY Nanotech, LaMar Hill (moderator); Nanometrics Inc., John Heaton; Applied Materials, Michele Klein; ReVera, Dave Perloff; Others TBA

 

Lithography Executive Viewpoints

Ludo Deferm, Vice President, Business Development, IMEC

Today, many potential showstoppers for immersion lithography have already been removed, and the feasibility and potential of the technology has been demonstrated. The key question now is its degree of extendibility over different technology generations.

Much work still remains to be done to make immersion lithography a yielding process step in IC manufacturing. At the same time, extreme UV has a long way to go before it can be inserted into manufacturing and, as such, it will be necessary to extend 193 nm immersion litho down to 32 nm CMOS. As a result, 193 nm immersion litho will be pushed to its limits, including the use of high-index fluids, double patterning techniques and chemically amplified resists.

Franklin Kalk, CTO, Toppan Photomasks

What's hot in lithography at SEMICON West? First, 193 nm immersion lithography integration. Production scanners are being delivered; by 2010, the L32/hp45 technology cycle will enter production with 193 nm water immersion lithography at NA<1.4. In the meantime, the wafer-side materials system will require development: resist, topcoat, immersion fluid, and lens (remember defect control). Looking to L22/hp32, SEMICON West attendees could witness heavy betting on EUV vs. double-exposure immersion.

On the photomask side, the effects of low k1 and hyper-NA also should be hot topics. Reducing k1 drives OPC accuracy, implying process control, metrology and RET verification beyond what's been required (sounds like DFM, doesn't it?). Complicating this: hyper-NA, which will require low birefringence mask blanks and improved pellicles to avoid transmission and phase errors; plus, there are the issues of better etch depth and sidewall control for altPSM intensity balancing, and improved mask absorbers for optimum polarization as minimum feature size approaches the wavelength.

And then there's haze — defect-free manufacturing's poster child. Haze's ancestry includes mask process and materials, wafer fab environment and mask handling, and wafer scanner environment. Efforts to prevent haze drive more mask-wafer lithography collaboration than any issue in recent memory.

Martin van den Brink, Executive Vice President, Marketing & Technology, ASML

Since its advent in the fall of 2003 as the solution for extending ArF to submicron technology nodes, immersion lithography has continued to progress rapidly toward volume production capabilities at 45 nm. Customers are now reporting test wafer production well within acceptable parameters, and the industry's recent success in lowering defectivity rates is noteworthy. These advances are essential because they allow users to turn their attention to the next phase in the development of immersion: achieving throughput improvements for economically feasible volume manufacturing.

Beyond 40 nm, things become more challenging since water-based immersion systems aperture will be limited to just below 1.44, the refractive index of water. For example, volume production at 32 nm presents significant cost and technical challenges for immersion. Approximately one-third of ASML customers polled this year prefer to pursue double patterning or "other" lithography technologies (such as high-index materials and fluids) in order to reach the 32 nm node by 2009. Most double-patterning technologies require improved overlay and would welcome higher productivity. But it is a complex process that requires additional infrastructure and high capital outlays. The bigger challenge for immersion at 32 nm is the materials issue, because true 32 nm half-pitch imaging depends on development of requisite high-index lens materials and fluids. We do not expect development of high-index materials to meet customers' timelines.

EUV is likely to be the most cost-effective as well as the most extendable option for the 32 nm node and beyond. EUV system integration is in progress, and first proof-of-concept images have been produced at 35 nm over the slit of 26 mm.

Sven Lofquist, CEO, Micronic Laser Systems AB

During the semiconductor industry's historic and steady migration to new technology nodes, equipment makers have faced a constant challenge: the need to be ready with new tools and technology two years ahead of expected production ramp.

But as the adoption of new technology nodes slows, the issue becomes more critical — and it is time to update that part of the business model. The equipment industry spends in the range of $6-8B in R&D annually. Adopting a just-in-time philosophy for production tools would release considerable amounts of these expenditures for more effective uses.

During the first step, the "copy exact" philosophy that has spread widely across the fab community is fine once you have qualified the production equipment, but a new approach is needed during the production phase. The industry will see more of dedicated R&D tools with limited productivity to support the manufacturing process. The second step will be qualification of the most economical production tool set. This approach will significantly reduce the time and, hence, the risk and cost in R&D spending for coming technology nodes.

The photomask business provides a good example of how this new model could work. E-beam systems are widely used for process development, while laser-based equipment meets the productivity and cost-of-ownership demands. The claim that the industry does not make a second qualification round of production equipment will be history and, in fact, that has never been the case in the photomask world. Production qualification has been held back during a consolidation phase characterized by overcapacity of unproductive e-beam tools. As the market now is more balanced, production qualification of cost- and time-efficient laser tools is accelerating.

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