Industry Connection
-- Semiconductor International, 12/1/2000
MESA (Manufacturing Execution Systems Association) International has elected new officers and board members to one-year terms. Maryanne Steidinger, executive director of marketing for Datasweep Inc., is the new chair. Ram Prabhakar, director of strategy for manufacturing services for digital supply chain practice, EDS Corp., is the new vice chair. Eric Marks of PriceWaterhouseCoopers is the past chair and Michael McClellan of MES Solutions is continuing to serve as treasurer. Other new members of the board include David Femia, president of Verid Technology Corp.; Jonathan Kall, president of Interwave Technology; and Andrew Robbie, product manager of GenRad. Christopher Zei, director of business development for Unifi Technology Group, will continue as a member at large. For further information, visit www.mesa.org.There is a call for papers for the European AEC/APC Conference, to be held in Dresden, Germany, April 19-20, 2001. The conference is for international professionals in the field of advanced equipment control/advanced process control. Topics includes new sensors and measurement tools; integration of metrology into production tools and manufacturing; equipment/process fault detection; control methods and software; and new products and future needs. All abstracts are due by Dec. 15, 2000. Full papers are required by March 9, 2001. Abstract proposals should be sent to aecapc_europe@tzd.tz-dd.de. For further information, visit www.aecapc-europe.com.
The International Symposium on Surface Contamination and Cleaning has issued a call for papers for the event, held May 24-25, 2001 in Newark, N.J. Symposium topics will include sources, forms and mechanisms of surface contamination; detection, analysis, characterization and control of contaminants; surface cleaning technology; atomically clean surfaces; and surface inspection methods. An abstract of about 200 words should be sent by Jan. 15, 2001, to the conference chairman via e-mail, fax or regular mail. For further information, visit http://mstconf.com/surfclean.htm.
IMAPS (International Microelectronics and Packaging Society) has issued a call for papers for its Advanced Technology Workshop on Thermal Management for High-Performance Computer and Wireless Applications, being held in Palo Alto, Calif., April 20-21, 2001. The ATW will focus on high-performance applications in computing and wireless/rf systems. A session on market drivers and economics will be added and abstracts are being solicited for all five sessions in the following areas: computing systems; wireless systems; thermal materials; market drivers and economics; and system-level and component-level integrated EMI and thermal management solutions. Other papers will be considered as space allows. The deadline for abstracts is Jan. 15, 2001. For further information, visit www.imaps.org.
Nominations for Fellow status is being sought from members of IEEE (Institute of Electrical and Electronics Engineers). Members may nominate other members "who have made outstanding contributions to the electrical and electronics engineering profession." The deadline for receipt of complete nominations is March 15, 2001. At the time of nomination, a candidate must be an IEEE Senior Member who has completed five years of service in any grade of membership and whose membership dues are current. For further information, visit www.ieee.org.
There is a call for papers from the International Symposium on Plasma & Process Induced Damage (P2ID). The symposium, which is being held May 13-15, 2001, in Monterey, Calif., is being sponsored by the American Vacuum Society, IEEE/Electron Devices Society and the Japan Society of Applied Physics. Paper topics include plasma and non-plasma process-induced degradation of devices and circuits; process-induced damage: mechanisms, reduction and recovery; ultra-thin gate dielectric degradation phenomenon and methods of detection; gate dielectric degradation effects on device or circuit reliability and performance; process damage modeling and simulation; process-related yield and reliability problems: contamination, defect generation, dopant migration and critical dimension control; damage-resistant new device structures, new circuit designs and new materials; plasma diagnostics of relevance to damage; and 300 mm-specific plasma processing house. The deadline for paper submissions is Feb. 2, 2001. For further information, visit www.p2id.org.
A call for papers has been issued for ITC (International Test Conference) 2001, which meets Oct. 30-Nov. 1, 2001, in Baltimore. This conference highlights the trade-off between investments in ATE, DFT, and design and test automation tools. Topics include ATE architectures for DFT; test synthesis tools for DFT; DFT techniques; test resource partitioning; test cost reduction techniques; test economics; DFT case studies; state-of-practice case studies; testability and time-to-market; design for test, manufacturing, debug, repair, FA and yield; and others. An abstract of 35 words or less is necessary. The submission deadline is March 16, 2001. Authors will be notified by June 8, 2001, and the manuscript deadline is July 27, 2001. For further information, visit www.itctestweek.org.
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