2000 Editors' Choice Best Product Awards
John Baliga, Associate Editor -- Semiconductor International, 12/1/2000
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At a Glance |
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The Editors' Choice Best Product Awards program, established in
1989, recognizes 20 products used in semiconductor and related
manufacturing every year. All of this year's winners were nominated
by users, and comments from users were used in the evaluations. This
year's Grand Award winner is the Momentum chemical mechanical
planarization system from SpeedFam-IPEC.
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For the
12th year, Semiconductor International has chosen 20 products used in the
semiconductor and related manufacturing industries to honor for their
excellence. The 2000 Grand Award winner, chosen from among the 20, is the
Momentum chemical mechanical planarization system from SpeedFam-IPEC (Chandler,
Ariz.). The Editors' Choice Best Product Awards program was established in 1989
to recognize superior performance of equipment, materials, software and other
products that advance wafer processing, chip assembly or packaging, or process
testing capabilities; enhance semiconductor or related manufacturing; improve
employee productivity or working conditions; or help a manufacturer to provide a
safer workplace or to be more environmentally responsible.
The Editors' Choice program differs from other product awards in that
products must be nominated by their users, not by the companies that make or
sell them. All 20 products presented on the following pages were nominated by
one or more knowledgeable users, and Semiconductor International's
editors used extensive comments from users in choosing the winners. Eligible
products must have been proven in a semiconductor or related manufacturing
environment before July 2000.
The editorial staff of Semiconductor International congratulates all
the winners of the 2000 Best Product Awards, presented here in alphabetical
order by company. We also urge readers to have their products nominated in next
year's competition, or to nominate a deserving product they may be using.
Finding a group of deserving candidates for the Editors' Choice awards is a
year-round effort. If you use equipment, materials, software or related products
in manufacturing semiconductors, MEMS devices, flat-panel displays or related
goods, and believe any of these products merits consideration for the 2001
Editors' Choice Best Products Awards, contact the magazine's editors for further
information about the program and the deadline for nominations.
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| This year's winners gathered in San Jose to
receive their awards. |
Semiconductor International recognizes that competitive advantages are
associated with the use of such products, and we keep all information provided
by users strictly confidential. Though it is necessary to confirm that products
are nominated by valid users, the information provided is not construed as an
endorsement. Confidentiality is scrupulously maintained to allow users to
nominate deserving products and give honest opinions.
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Applied
Materials
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| Applied Materials' Quantum LEAP Ion
Implanter | The Quantum LEAP Ion
Implanter from Applied Materials (Santa Clara, Calif.) is designed for
ultra shallow source/ drain, contact and extension implants, as well as
gate doping and pre-amorphization implants. It has a broad energy range
(200 eV to 80 keV), and depth control of ±1 Å for sub-keV implants. A
wafer reorienter is an option for its tilt control capability, to allow
implants at four different angles on the same wafer while maintaining a
throughput of more than 120 wafers per hour for 200 mm wafers and more
than 90 per hour for 300 mm
wafers.
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Applied
Precision
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| Applied Precision's waferWoRx Probing
Process Analysis System | The waferWoRx
Probing Process Analysis System from Applied Precision (Issaquah, Wash.)
analyzes test probe scrub marks left on bonding pads to evaluate the
probing process. The system provides data for corrective action in the
development or control of a probing process to help reduce pad damage, to
allow smaller pads and tighter pitches, to optimize probe positioning, to
determine probe card drift and to determine the probe card
life.
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ASM
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| ASM's Epsilon E-2000 Epitaxial
Reactor | ASM (Bilthoven, Netherlands)
has two winning products in this year's competition.
The Epsilon E-2000 Epitaxial Reactor is used to grow doped and undoped
silicon and polysilicon films in blanket layer applications as well as
selective and second layer films on patterned wafers. The system has a
high degree of control for film thickness, resistivity, slip and
particulate generation. It is capable of both reduced pressure and
atmospheric processing, and has been instrumental in the development of
silicon germanium and poly-germanium processes.
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| ASM's Pulsar 2000 Atomic Layer CVD
Reactor | The Pulsar 2000 Atomic Layer
CVD Reactor is used in the development of deposition processes where films
are grown one atomic layer at a time. Using steps that self-limit at one
layer each, the system can deposit highly conformal and uniform films at
low temperatures, with a very low occurrence of pinholes. It can be used
for depositing insulating metal oxides, barrier layers or any other layer
requiring atomic-layer thickness control.
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BOC
Edwards
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| BOC Edwards' TCU 40/80 High
Performance Temperature Control Unit
| The TCU 40/80 High Performance
Temperature Control Unit from BOC Edwards (Wilmington, Mass.) provides
temperature control of wafers during processes such as plasma etching. It
can provide control to ±1°C in the -40 to +80°C range. Because it uses a
perfluorinated coolant, it works in high magnetic and electric fields
without any difficulties |
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Boxer
Cross
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| Boxer Cross' BX-10 Source/Drain and
Ultra Shallow Junction Measurement System
| The BX-10 Source/ Drain and Ultra
Shallow Junction Measurement System from Boxer Cross (Menlo Park, Calif.)
uses a two-laser-beam technique called carrier illumination to
characterize ultra shallow junctions. The system provides non-contact
monitoring of junction depths and amorphous layer thickness in
pre-amorphizing implant applications to angstrom-level accuracy, and dose
level for low-dose applications to an accuracy of 1010
cm-2.
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Cymer
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| Cymer's ELS-6000 248 nm KrF Excimer
Laser | The ELS-6000 248 nm KrF Excimer
Laser from Cymer (San Diego) is used in the world's most advanced
production deep ultraviolet scanners and steppers. In addition to having
well controlled bandwidth and dose stability, the laser can produce 2000
pulses per second, which reduces exposure time compared with 1000 Hz
systems by 50%, and increases throughput by
35%.
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The Dow Chemical
Company
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| The Dow Chemical Co.'s SiLK
Semiconductor Dielectric Resin | The
SiLK Semiconductor Dielectric Resin from The Dow Chemical Company
(Midland, Mich.) is a spin-on aromatic hydrocarbon polymer material for
applications requiring a low-k dielectric. With a k value of 2.65, the
material reduces capacitive coupling between on-chip interconnects.
Different formulations of the material can be made for specific
applications, including one for copper dual damascene structures that does
not require an adhesion layer |
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Electro Scientific
Industries
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| Electro Scientific Industries' Model
9800 Laser Semiconductor Processing System
| The Model 9800 Laser Semiconductor
Processing System from Electro Scientific Industries (Portland, Ore.) uses
a 1.34 µm laser to open fuses in memory devices on 200 and 300 mm wafers.
The system provides programmable pulse energy, pulse width and spot size
capability, with accuracy better than 0.25 µm to optimize throughput while
providing the optimum pulse characteristics for different memory
devices.
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ESEC
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| ESEC's 2008 Die
Bonder | The 2008 Die Bonder from ESEC
(Cham, Switzerland) features a high-performance pick-and-place module, a
force-controlled bond head and programmable dispenser. The bond head
allows for low stress picking and handling of the die, making it suitable
for demanding smart card applications using very thin die. The dispenser
can provide any pattern required, and the entire system is easily
configurable for any die bonding
application.
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FSI
International
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| FSI International's DIO3
Generation Module | The DIO3
Generation Module from FSI International (Chaska, Minn.) provides ozonated
water for the company's Zeta wafer cleaning tool. Since the ozonation is
done at the point of use, and under pressure, ozone concentrations up to
120 ppm can be achieved. Ozonated water has been used for photoresist
stripping, and is currently being evaluated for providing a more
environmentally friendly method of cleaning
wafers.
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J.A.
Woollam
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| J.A. Woollam's VUV-VASE
| VUV-VASE from J.A. Woollam
(Lincoln, Neb.) is a vacuum ultraviolet variable angle spectroscopic
ellipsometer for determining the optical properties of films from
145 to 1700 nm. It has been used in the characterization of 157
nm-based lithography processes, and has the flexibility to measure
the composition and thickness of oxynitride and perovskite gate
materials, as well as high-bandgap semiconductor
materials.
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KLA-Tencor
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| KLA-Tencor's Catalyst
| Catalyst from KLA-Tencor (San Jose)
enables the development and deployment of advanced process control
throughout the fab. It supports both feedforward and feedback in
run-to-run process control implementations, enabling the adjustment of
process recipes to compensate for tool variations such as drift and
variations on incoming wafer lots. This level of control keeps wafer state
parameters much closer to their nominal values throughout, leading to
improved binout yield.
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Kulicke &
Soffa
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| Kulicke & Soffa Industries' Model
7700twin Wafer Dicing System | The
Model 7700twin Wafer Dicing System from Kulicke & Soffa Industries
(Willow Grove, Pa.) has a face-to-face twin spindle design that minimizes
overtravel, providing higher throughput than conventional single and dual
spindle dicing saws. Its blade load monitoring system provides real-time
insight into the blade-wafer interaction, allowing the detection of cut
quality deviations. Combined with its high degree of coolant flow control,
the monitoring system can provide an early warning of potential reject in
addition to making the process stable.
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March
Instruments
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| March Instruments' ITRAK In-Line Plasma System
| The ITRAK In-Line Plasma System from
March Instruments (Concord, Calif.) cleans organic package substrates to
improve die bonding, wire bonding and molding processes. Its in-line
capability provides improved work in process flow and it allows the next
step to be performed shortly after the cleaning step. Its design allows a
throughput of over one strip per minute, allowing one machine to provide
cleaning for several machines at the next
step.
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Pacific Scientific
Instruments
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| Pacific Scientific Instruments-Met One's R8801
Remote Airborne Particle Counter | The
R8801 Remote Airborne Particle Counter from Pacific Scientific
Instruments-Met One (Grants Pass, Ore.) uses a diode-pumped solid-state
laser to detect particles down to 0.10 µm at flow rates of 0.10 cfm. The
low power it uses - 2 to 5 V compared with 1.5 kV for HeNe lasers -
minimizes any potential interference with production tools. Its remote
sensor design allows air quality to be monitored in real time where it is
needed, without interfering with the production
process.
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Sagitta
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| Sagitta's NEXT-1 Automatic
Cross-Sectioning Polisher | The
NEXT-1 Automatic Cross-Sectioning Polisher from Sagitta (Ramat Gan,
Israel) provides submicron polishing capability for the preparation
of SEM, TEM and other samples for failure analysis. It provides 0.1
µm accuracy in a preparation process that takes only 30 minutes,
even in applications such as cross-sectioning plugs and other
interconnect
structures.
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SemiTest
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| SemiTest's Epimet Model 2 Non-Contact
Epi Resistivity Monitor | The Epimet
Model 2 Non-Contact Epi Resistivity Monitor from SemiTest (Billerica,
Mass.) performs non-destructive monitoring of epitaxial layer resistivity
and dopant profiles. It can measure both n- and p-type silicon with the
same simple process that provides 1%
repeatability.
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Speedline
Technologies
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| Speedline Technologies' Camalot 5700
Dispensing System | The Camalot 5700
Dispensing System from Speedline Technologies (Franklin, Mass.) provides
continuous dispensing capability for underfill and encapsulation
applications. It has automated weight and volumetric control capability
and non-contact z-axis sensing for highly accurate and fully automated
dispensing.
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Grand Award
Winner
SpeedFam-IPEC
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| SpeedFam-IPEC's Momentum Chemical
Mechanical Planarization System | The
Momentum chemical mechanical planarization system, this year's Grand Award
winner from SpeedFam-IPEC (Chandler, Ariz.), provides flexible dry-in,
dry-out capability. In addition to cleaning capability, advanced metrology
and automation, it has four independent platens, allowing it to
simultaneously perform process development and production operation. It
supports seamless migration from one process to
another.
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