At a Glance
-- Semiconductor International, 2/1/2000
The motivation for mix-and-match lithography tools is cost. The downside is overlay performance. The best overlay can be achieved if exposures at all levels are performed on the same equipment. Here, SI discusses the issues and strategies of matching steppers to scanners and speculates on matching optical tools to some of the NGLs.
Related Content
By This Author
There are no other articles written by this author.