ITC 2002
Staff -- Semiconductor International, 9/15/2002
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The International Test Conference (ITC) returns to the Baltimore Convention Center Oct. 8-10 with the theme "Stressing the Fundamentals." This conference focuses on the electronic test of devices, boards and systems, covering the complete cycle from design verification, test, diagnosis and failure analysis to process and design improvement. ITC Test Week events include formal paper sessions, tutorials, panel sessions, case studies, lecture series, commercial exhibits and presentations, and professional meetings. New this year is the University Booth, where the university community will display research results and demonstrate software tools in areas such as design verification, test, diagnosis and failure analysis.
For more information, visit www.itctestweek.org.
Show hours:Oct. 8, 9:30 a.m.- 6 p.m.
Oct. 9, 9:30 a.m.- 6 p.m.
Oct. 10, 9:30 a.m.-3 p.m.