Empty Spaces in Silicon (ESS): An Alternative to SOI
Peter Singer, Editor-in-Chief -- Semiconductor International, 12/1/1999
In the future, the ability to form empty spaces in silicon could prove very useful, since air gaps are excellent insulators. Silicon voids could possibly replace some applications of dielectric materials, such as those used in silicon-on-insulator (SOI). SOI requires buried islands of an insulator, typically oxide, which could be replaced by an air gap.
The challenge in forming air gaps has so far been that it's difficult to do with the kind of precision needed for mass-produced, high-density devices. This could soon change, however, thanks to some recent research at Toshiba Corp. in Yokohama, Japan. Scientists there have developed a new technique based on silicon migration that is able to precisely form empty spaces in silicon of various shapes, including pipes, spheres and plates. The work is scheduled to be presented this month at the International Electron Devices Meeting (IEDM) in Washington, D.C.
The proposed technique for the formation of empty spaces in silicon (ESS) makes use of the self-organizing migration properties on the silicon surface. The Toshiba researchers explain that when deeply etched silicon substrates are annealed in a deoxidizing ambient, such as a hydrogen ambient, the silicon atoms on the surface migrate so as to minimize the surface energy. The sequence for the empty space formation is schematically illustrated in Fig. 1, where three typical shapes are shown: (a) sphere, (b) pipe and (c) plate.
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Fig. 1
The self-organizing sequence for the empty space formation in
silicon. Spherical empty space is formed at the bottom of the trench (a).
Pipe-shaped empty space can be formed by combining the spherical empty
spaces at the bottom of each trench (b). Plate-shaped empty space also can
be formed when trenches are arranged in a lattice (c). Empty spheres with
uniform size and shape, spaces at regular intervals, were formed beginning
with a deep (6.5mm) trench,
followed by an anneal in a hydrogen ambient at
1100°C. |
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Results are in from
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