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Atomic Layer Deposition Targets Thin Films

Peter Singer, Editor-in-Chief -- Semiconductor International, 9/1/1999

A promising new method of depositing very thin films has been developed for a variety of applications, including gate dielectrics, DRAM capacitor dielectrics and diffusion barriers. The new technique, called atomic layer deposition (ALD) or atomic layer chemical vapor deposition (ALCVD), is said to have several advantages over traditional CVD techniques: it can be done at lower temperatures, use a wider range of precursors, produce very thin films, inherently obtain 100% step coverage, and be used to 'microengineer' complex film matrices.

At SEMICON West this year, two deposition equipment suppliers touted ALCVD capabilities. ASM (Bilthoven, Netherlands), through its acquisition of Microchemistry Ltd., now has several systems capable of ALCVD for semiconductor and flat-panel display applications. Genus (Sunnyvale, Calif.) also announced a new ALD capability on its Lynx2 platform.

ALCVD works quite differently from conventional CVD techniques. Instead of mixing two or more reactant gases inside the deposition chamber -- where they either react in the gas phase and fall to the wafer surface or react on the wafer surface -- ALCVD introduces one reactant gas at a time. Through a process known as 'chemisorption,' a monolayer of the first gas is absorbed on the wafer surface. 'In ALD, individual precursors are pulsed onto the surface of the wafer in a sequential manner, without mixing precursors in the gas phase,' explains Tom Seidel of Genus. 'Each individual precursor reacts with the surface to form an atomic layer in such a way that only one layer can form at a time. This is because the surface reaction occurs such that the reaction is complete, and permits no more than one layer at a time to be deposited, no matter how many molecules are applied to the surface in an overdosing mode.' Films are built up by introducing short bursts of gases in cycles.

Atomic layer CVD works by introducing one reactant gas at a time. The first gas is 'chemisorped' onto the wafer surface. Excess gas is then purged and the second gas (in this case, wafer vapor) introduced. This gas reacts with the chemisorped layer, creating a monolayer of deposited film.
ASM's Chris Werkhoven explained how ALCVD would work using silane and oxygen to deposit a thin oxide layer: 'At room temperature, you will have an absorption or chemisorption of one monolayer of silane molecules on the surface. If you keep the temperature low enough, the silane molecules form a stable chemisorped layer. What you then can do is pump the residual silane off, and replace that gas with oxygen or water vapor, which reacts with the absorbed silane molecules and forms an oxide. Now you have one monolayer of oxide.' The accompanying illustration shows an ALCVD process for a depositing Al2O3 using Al(CH3)3 and water vapor as precursors.

To be useful in semiconductor manufacturing production applications, ALCVD must demonstrate acceptable throughput. Werkhoven said that by quickly switching the gases off (in less than 1 sec.), it is possible to get reasonable growth rates, up to 200 Å/min. Considering many films are deposited in thickness of only 10-50 Å -- or less -- that should be acceptable.

Beyond the ability to get highly conformal films -- even better than MOCVD, according to Werkhoven -- a unique advantage of ALCVD is that it enables the use of a whole new range of precursors. Also, conventional CVD processes typically operate above 500°C, while ALCVD works below 400°C -- which also is more compatible with the industry's trend to lower temperatures. 'From that point of view, the processing window of ALCVD is usually quite a bit bigger than more conventional CVD,'' Werkhoven said. Since process conditions and gas types can be changed for each cycle, it's also possible to construct 'laminates' where a sandwich is built up of materials with different properties. This kind of 'microengineering' can result in laminates with superior properties.   

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