Erratum
-- Semiconductor International, 1/1/1999
In
addition to Sandia Laboratories, critical contributions to the development,
refinement and acceptance of the bipolar low-dose-rate test method discussed in
'Protection for Satellite Electronics' (Emerging Technologies, October 1998)
were made by Defense Special Weapons Agency Consortium members: RLP Research
Inc., Vanderbilt University, The Aerospace Corp., the Jet Propulsion Laboratory,
the Naval Surface Warfare Center and the Naval Research Laboratory. 
