Port Scale RF Test Solution
By Semiconductor International Staff -- Semiconductor International, 11/1/2008
The V93000 SoC Test Platform provides reliable RF measurement capability to test emerging high-integration devices with integrated RF, mixed signal, digital, power management, embedded or stacked memory, and low-integration RF transceivers. It has a solid-state design with RF resources in the test head. The Port Scale RF tool can be configured with 12, 24 or 48 RF ports. True quad-site is achieved with 24 RF ports and its parallel efficiency addresses the port count required by high-integration devices and test efficiency for the lowest cost of test, with accurate, stable measurements and the industry's lowest noise floor (-161 dBm/Hz). Verigy, Cupertino, Calif., www.verigy.com
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