Log In   |  Register Free Newsletter Subscription
Skip navigation
Zibb
Subscribe to Semiconductor International
RSS
Reprints/License
Print
Email

Digital Microscope

By Semiconductor International Staff -- Semiconductor International, 1/1/2009

The iVista LC High-Resolution Digital Microscope is designed to meet the increasing need in semiconductor failure-analysis labs for high-resolution digital images in conjunction with laser-cutting capabilities, significantly improving productivity. Resolution is comparable to a 16 Mpixel, color CCD, meaning that even the tiniest features are quickly and easily identifiable. Unlimited digital zooming provides more detail. A standard laser port is available to mount laser cutters from all manufacturers. SUSS MicroTec Test Systems, Sacka, Germany, www.suss.com

RSS
Reprints/License
Print
Email
Talkback
Related Content
»MORE

Reed Business Information Resource Center

Featured Company


Most Recent Resources

Advertisement

Related Microsite Content

Related Links

More Content
  • Blogs
  • Podcasts
  • Videos

Sorry, no blogs are active for this topic.

VIEW ALL BLOGS RSS
  • SIA President Talks About Industry’s Recovery, Future


    In this month's podcast, George Scalise, president of the Semiconductor Industry Association (SIA), talks about the semiconductor industry's prospects at the start of its recovery from one of the worst downturns in history, as well as the challenges it faces in global competition, regulation, and the introduction of new technologies.

    Hear It Now
  • The Coming of EUV Lithography – When?


    Senior Editor Alexander E. Braun interviews Toppan Photomasks CTO Franklin Kalk at the SPIE Photomask conference about the status of lithography in general and EUV lithography development in particular. Kalk believes considerable work and development still remain to be done for EUV to become a mainstream reality. Hear It Now
  More Videos>>

SUSSWebinar_Oct09_MktgMod
Advertisement
NEWSLETTERS
SI NewsBreak and Special Reports
Photovoltaics Report
Wafer Processing Report
Litho & Metrology Report
Packaging Report



Please read our Privacy Policy

OTHER NEWS FROM RBI
About Us   |   Advertising Info   |   Site Map   |   Contact Us   |   FREE Subscription   |   RSS
© 2010 Reed Business Information, a division of Reed Elsevier Inc. All rights reserved.
Use of this Web site is subject to its Terms of Use | Privacy Policy
Please visit these other Reed Business sites