Acoustic Microscope Imaging
By Semiconductor International Staff -- Semiconductor International, 8/1/2008
The HiRes Generation THRU-Scan was developed to enhance through-transmission imaging for the company's C-SAM line of acoustic microscopes. THRU-Scan images the whole thickness of a sample in one scan. It reveals a defect or anomaly at any depth, and provides a non-destructive method for determining whether an internal defect is present. It is often used in combination with reflection-mode imaging to simultaneously verify the x-y location of a defect and specify its depth. Penetration is not sacrificed. Sonoscan Inc., Elk Grove Village, Ill., www.sonoscan.com
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