Characterization System
4200-SCS
Staff -- Semiconductor International, 6/16/2001
Model 4200-SCS semiconductor characterization system provides lab-grade dc device characterization with real-time plotting and analysis. The instrument structure allows simultaneous measurement of up to eight measurement channels and software that requires only one mouse click to move between tests. The built-in software supports setup, data collection, analysis and data storage. It supports CV meters, switching matrixes and related test equipment. It is available in several configurations for local or remote sense. SEMICON West Booth 10832-SJ
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