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Stepper Reticle

Staff -- Semiconductor International, 6/1/1999

This reticle allows tool matching using a single test reticle. This technology provides the tightest match between two different types of tools, even those from different manufacturers. The two reticles were designed to allow pattern overlay on the same wafer, giving a foundation for stage precision, X and Y stage scaling, baseline and microscope rotation measurements. It enables grid and field matching errors. The data can be saved in a reference standard database for statistical analysis and for future matching and calibration.

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